Events

Class Visit: CS 5785/ORIE 5750/ECE 5414:Applied Machine LearningBy: Ayush Sekhari & Joerg Blumtritt

Learn and apply key concepts of modeling, analysis, and validation from machine learning, data mining, and signal processing to analyze and extract meaning from data. Students implement algorithms and perform experiments using images, text, audio, and mobile sensor measurements. Topics include supervised and unsupervised techniques such as classification, regression, clustering, feature selection, and dimensionality reduction